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High-Resolution Characterization of Oxygen Incorporation in Erbium Dihydride Thin Films

Published online by Cambridge University Press:  03 August 2008

CM Parish ,
CS Snow  and
LN Brewer
CM Parish
Affiliation:
Sandia National Laboratories
CS Snow
Affiliation:
Sandia National Laboratories
LN Brewer
Affiliation:
Sandia National Laboratories
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 648 - 649
Copyright
© 2008 Microscopy Society of America

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