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High-Resolution and High-Throughput Ptychography with Depth Sensitivity Using Multilayer Laue Lenses

Published online by Cambridge University Press:  10 August 2018

Xiaojing Huang*
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Hande Ozturk
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Hanfei Yan
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Yan He
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Shanghai201204, China
Mingyuan Ge
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Zhihua Dong
Affiliation:
Computational Science Initiative, Brookhaven National Laboratory, Upton, NY11973, USA
Meifeng Lin
Affiliation:
Computational Science Initiative, Brookhaven National Laboratory, Upton, NY11973, USA
Evgeny Nazaretski
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Petr Ilinski
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
Ian Robinson
Affiliation:
Condensed Matter Physics and Materials Department, Brookhaven National Laboratory, UptonNY11973, USA London Centre for Nanotechnology, University College London, London, WC1H 0AH, UK
Yong Chu
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY11973, USA
*
*Corresponding author: xjhuang@bnl.gov

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

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[8] The authors acknowledge the Laboratory Directed Research and Development (LDRD-21690) program. This research used resources of the National Synchrotron Light Source II, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704.Google Scholar