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Highly Depth-sensitive TEM Imaging of Graphene by using Monochromatic Electron Source at Low Accelerating Voltage

Published online by Cambridge University Press:  01 August 2018

Shigeyuki Morishita ,
Ryosuke Senga ,
Yung-Chang Lin ,
Hidetaka Sawada  and
Kazu Suenaga
Shigeyuki Morishita
Affiliation:
JEOL Ltd, Akishima, Tokyo, Japan.
Ryosuke Senga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan.
Yung-Chang Lin
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan.
Hidetaka Sawada
Affiliation:
JEOL Ltd, Akishima, Tokyo, Japan.
Kazu Suenaga
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1610 - 1611
Copyright
© Microscopy Society of America 2018 

References

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