Article contents
Highly Depth-sensitive TEM Imaging of Graphene by using Monochromatic Electron Source at Low Accelerating Voltage
Published online by Cambridge University Press: 01 August 2018
Abstract
![Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'](https://static.cambridge.org/content/id/urn%3Acambridge.org%3Aid%3Aarticle%3AS143192761800853X/resource/name/firstPage-S143192761800853Xa.jpg)
- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1610 - 1611
- Copyright
- © Microscopy Society of America 2018
References
- 1
- Cited by