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High Throughput Quantitative Phase Mapping Using Synchrotron X-Ray Diffraction
Published online by Cambridge University Press: 25 July 2016
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 86 - 87
- Copyright
- © Microscopy Society of America 2016
References
[2] Bruker Corporation.Google Scholar
[4] The authors gratefully acknowledge funding support from the New York State Energy Research and Development Authority (NYSERDA) via the New York Battery and Energy Storage Technology Consortium (NY-BEST). NYSERDA has not reviewed the information contained herein, and the opinions expressed in this report do not necessarily reflect those of NYSERDA or the State of New York.Google Scholar
[5] The authors deeply appreciate Dr. K. Chapman’s help in the experiments done in Beamline 11-ID-B, Advanced Photon Source, Argonne National Laboratory. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. Use of the National Synchrotron Light Source, Brookhaven National Laboratory, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-98CH10886.Google Scholar
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