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High Spatial Resolution Low-Voltage Electron Imaging and Spectroscopy of Two-Dimensional Materials and Semiconductor Nanostructures

Published online by Cambridge University Press:  05 August 2019

Xiaoqing Pan ,
Xingxu Yan ,
Chaitanya A. Gadre  and
Toshihiro Aoki
Xiaoqing Pan
Affiliation:
Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USA. Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, USA. Irvine Materials Research Institute (IMRI), University of California - Irvine, Irvine, CA, USA.
Xingxu Yan
Affiliation:
Department of Materials Science and Engineering, University of California - Irvine, Irvine, CA, USA.
Chaitanya A. Gadre
Affiliation:
Department of Physics and Astronomy, University of California - Irvine, Irvine, CA, USA.
Toshihiro Aoki
Affiliation:
Irvine Materials Research Institute (IMRI), University of California - Irvine, Irvine, CA, USA.

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 468 - 469
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Lagos, MJ et al. , Nature 543 (2017), p. 529.Google Scholar
[2]Hage, FS et al. , Sci. Adv. 4 (2018), p. eaar7495.Google Scholar
[3]Govyadinov, AA et al. , Nat. Commun. 8 (2017), p. 95.Google Scholar
[4]Konečná, A et al. , Phys. Rev. B 98 (2018), p. 205409Google Scholar
[5]Chang, H-T et al. , Nanoscale 6 (2014), p. 3593.Google Scholar
[6]This work was supported by the Department of Energy (DOE) under Grant DE-SC0014430. The authors acknowledge the support of the University of California Irvine Materials Research Institute for the use of TEM facilities.Google Scholar