Hostname: page-component-8448b6f56d-dnltx Total loading time: 0 Render date: 2024-04-19T05:27:09.372Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution Imaging in the Field Emission Scanning Electron Microscope at Low Accelerating Voltage and with Energy-Filtration of the Electron Signals

Published online by Cambridge University Press:  27 August 2014

Raynald Gauvin ,
Nicolas Brodusch ,
Hendrix Demers  and
Patrick Woo
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada
Patrick Woo
Affiliation:
Hitachi High-Technologies Canada Inc., Toronto, Canada

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 16 - 17
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Goldstein, J.I., et al, “Scanning Electron Microscopy and X-Ray Microanalysis”, (Springer, 3rd edition (2003).Google Scholar
[2] Wells, O.C. “The construction of a scanning electron microscope and its application to the study offibres”, Ph.D. Dissertation, (Cambridge University, England, 1957).Google Scholar
[3] Wells, O. C. Scanning, 2 (1979), pp. 199-216.Google Scholar
[4] Joy, D.C. Journal of Microscopy, 208 (2002), pp. 24-34.Google Scholar
[5] Kim, J. et al, Journal of Vacuum Science Technology B, 25 (2007), pp. 1771-1775.Google Scholar