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High Resolution Imaging and X-Ray Microanalysis with STEM in the FE-SEM

Published online by Cambridge University Press:  23 November 2012

R. Gauvin ,
P. Michaud ,
N. Brodusch  and
M.L. Trudeau
R. Gauvin
Affiliation:
Materials Engineering, McGill University, Montreal, Quebec, Canada
P. Michaud
Affiliation:
Materials Engineering, McGill University, Montreal, Quebec, Canada
N. Brodusch
Affiliation:
Materials Engineering, McGill University, Montreal, Quebec, Canada
M.L. Trudeau
Affiliation:
Institut de Recherche d’Hydro-Québec, Varennes, Quebec, Canada
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 390 - 391
Copyright
Copyright © Microscopy Society of America 2012

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