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High Resolution EELS of Point Defects in a Nitride Semiconductor Material
Published online by Cambridge University Press: 01 August 2018
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 430 - 431
- Copyright
- © Microscopy Society of America 2018
References
[2] The use of facilities within the Eyring Materials Center at Arizona State University is acknowledged. X. Li, T. Detchprohm and R.D. Dupuis are acknowledged for growing the materials.Google Scholar