Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-25T17:07:49.057Z Has data issue: false hasContentIssue false

High Resolution and Energy-Filtered TEM Imaging of Pd Diffusion in Crystalline Si

Published online by Cambridge University Press:  05 August 2007

J Risner-Jamtgaard
Affiliation:
Hitachi Global Storage Technologies,Inc
X Xu
Affiliation:
Hitachi Global Storage Technologies,Inc
Q-F Xiao
Affiliation:
Hitachi Global Storage Technologies,Inc
D Yaney
Affiliation:
Hitachi Global Storage Technologies,Inc
L Vinh
Affiliation:
Hitachi Global Storage Technologies,Inc
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)