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HAADF and EELS Combined Studies of a New Generation of Materials for Ni-MH Batteries

Published online by Cambridge University Press:  08 April 2017

V Serin ,
C Magen ,
R Serra ,
M Ibarra ,
M Hÿtch ,
J Zhang ,
L Lemort ,
M Latroche ,
B Knosp  and
P Bernard
V Serin
Affiliation:
Centre National de la Recherche Scientifique, Université Paul Sabatier, France
C Magen
Affiliation:
TALEM, Instituto de Nanociencia de Aragón, France
R Serra
Affiliation:
Centre National de la Recherche Scientifique, Université Paul Sabatier, France
M Ibarra
Affiliation:
Universidad de Zaragoza
M Hÿtch
Affiliation:
CEMES-CNRS, TALEM, France
J Zhang
Affiliation:
CMTR, ICMPE-CNRS, France
L Lemort
Affiliation:
CMTR, ICMPE-CNRS, France
M Latroche
Affiliation:
CMTR, ICMPE-CNRS, France
B Knosp
Affiliation:
Instituto de Nanociencia de Aragón, Spain
P Bernard
Affiliation:
SAFT, France

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 788 - 789
Copyright
Copyright © Microscopy Society of America 2011