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Grain Boundary Engineering at the Interface of Ceramic and Composite Materials used in Alternative Energy Technologies

Published online by Cambridge University Press:  27 August 2014

L. Saraf ,
T. Darroudi ,
O. Dillon ,
J. J. Clarke  and
G. Wetzel
L. Saraf
Affiliation:
Electron Microscopy Laboratory, Clemson University, Clemson SC 29634
T. Darroudi
Affiliation:
Electron Microscopy Laboratory, Clemson University, Clemson SC 29634
O. Dillon
Affiliation:
Electron Microscopy Laboratory, Clemson University, Clemson SC 29634
J. J. Clarke
Affiliation:
Hitachi High Technologies America Inc., Clarksburg, MD 20871
G. Wetzel
Affiliation:
Electron Microscopy Laboratory, Clemson University, Clemson SC 29634

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1910 - 1911
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Huang, C, Xiao, J, Shao, Y, Zheng, J, Bennett, W, Lu, D, Saraf, L, Engelhard, M, Ji, L, Zhang, J, Li, X, Graff, G, Liu, J Nature Communications, 5 (2014), 3015.Google Scholar
[2] Shao, Y, Xiao, J, Wang, W, Engelhard, M, Chen, X, Nie, Z, Gu, M, Saraf, L, Exarhos, G, Zhang, J, Liu, J Nano Letters, 13 (2013), 3909.Google Scholar
[3] Cao, Y, Xiao, L, Sushko, M, Wang, W, Schwenzer, B, Xiao, J, Nie, Z, Saraf, L, Yang, Z, Liu, J Nano Letters, 12 (2012), 3783.Google Scholar
[4] Wang, D, Choi, D, Li, J, Yang, Z, Nie, Z, Kou, R, Hu, D, Wang, C, Saraf, L, Zhang, J, Aksay, I, Liu, J ACS Nano, 3 (2009), 907.Google Scholar
[5] Saraf, L Microscopy and Microanalysis, 18 (2012), 371.Google Scholar
[6] Saraf, L, Baer, D, Lea, A, Zhu, Z, Strohm, J, Sitzman, S, King, D Journal of the Electrochemical Society, 157 (2010), B463.Google Scholar
[7] Saraf, L, Shutthanandan, V, Zhang, Y, Thevuthasan, S, Wang, C, El-Azab, A, Baer, D Journal of Applied Physics, 96 (2004), 5756.Google Scholar
[8] The authors acknowledge usage of microscopy resources at Clemson University, Hitachi High Technologies America and at Pacific Northwest National Laboratory for this work.Google Scholar