Skip to main content Accessibility help
×
Home
Hostname: page-component-66d7dfc8f5-hmz2h Total loading time: 0.297 Render date: 2023-02-08T21:01:21.562Z Has data issue: true Feature Flags: { "useRatesEcommerce": false } hasContentIssue true

Graded Microstructure of Additive Manufactured Ti-6Al-4V via Electron Beam Melting

Published online by Cambridge University Press:  05 August 2019

Hansheng Chen
Affiliation:
School of Aerospace, Mechanical, and Mechatronic Engineering, The University of Sydney, Sydney, NSW, Australia. The University of Sydney Nano Institute, The University of Sydney, Sydney, NSW, Australia. Australian Center for Microscopy and Microanalysis, The University of Sydney, NSW, Australia.
Christopher Cooper
Affiliation:
School of Aerospace, Mechanical, and Mechatronic Engineering, The University of Sydney, Sydney, NSW, Australia.
Cameron Durrant
Affiliation:
School of Aerospace, Mechanical, and Mechatronic Engineering, The University of Sydney, Sydney, NSW, Australia.
Yingluo Li
Affiliation:
School of Aerospace, Mechanical, and Mechatronic Engineering, The University of Sydney, Sydney, NSW, Australia.
Sophie Primig
Affiliation:
School of Materials Science and Engineering, The University of Sydney, Sydney, NSW, Australia.
Xiaozhou Liao
Affiliation:
School of Aerospace, Mechanical, and Mechatronic Engineering, The University of Sydney, Sydney, NSW, Australia.
Sudarsanam Suresh Babu
Affiliation:
Department of Mechanical, Aerospace, and Biomedical Engineering, University of Tennessee, Knoxville, Tennessee, TN, USA. Manufacturing Demonstration Facility, Oak Ridge National Laboratory, Knoxville, TN, USA.
Simon P. Ringer*
Affiliation:
School of Aerospace, Mechanical, and Mechatronic Engineering, The University of Sydney, Sydney, NSW, Australia. Australian Center for Microscopy and Microanalysis, The University of Sydney, NSW, Australia.
*
*Corresponding author: simon.ringer@sydney.edu.au

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Sames, WJ et al. , International Materials Reviews 61(5) (2016), p. 315.CrossRefGoogle Scholar
[2]Dehoff, RR et al. , Materials Science and Technology 31(8) (2015), p. 931.CrossRefGoogle Scholar
[3]Xu, W et al. , Acta Materialia 125 (2017), p. 390.CrossRefGoogle Scholar
[4]Sabban, R et al. , Acta Materialia 162 (2019), p. 239.CrossRefGoogle Scholar
[5]Haubrich, J et al. , Acta Materialia (2019).Google Scholar
[6]The authors acknowledge the facilities and the scientific and technical assistance of Microscopy Australia at the Australian Centre for Microscopy & Microanalysis at the University of Sydney. The research was sponsored by the Department of the Navy, Office of Naval Research under ONR award number N00014-18-1-2794. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the Office of Naval Research. The research was also sponsored by the US Department of Energy, Office of Energy Efficiency and Renewable Energy, Advanced Manufacturing Office under contract DE-AC05-00OR22725 with UT-Battelle, LLC. Access to the Oak Ridge National Laboratory's (ORNL) additive manufacturing equipment at ORNL's Manufacturing Demonstration Facility (MDF) was facilitated by US Department of Energy's Strategic Partnership Projects (SPP) mechanism. More information can be found at https://science.energy.gov/lp/strategic-partnership-projects. Research sponsored by the U.S. Department of Energy, Office of Energy Efficiency and Renewable Energy, Industrial Technologies Program, under contract DE-AC05-00OR22725 with UT-Battelle, LLC.Google Scholar
You have Access

Save article to Kindle

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Graded Microstructure of Additive Manufactured Ti-6Al-4V via Electron Beam Melting
Available formats
×

Save article to Dropbox

To save this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Dropbox account. Find out more about saving content to Dropbox.

Graded Microstructure of Additive Manufactured Ti-6Al-4V via Electron Beam Melting
Available formats
×

Save article to Google Drive

To save this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Google Drive account. Find out more about saving content to Google Drive.

Graded Microstructure of Additive Manufactured Ti-6Al-4V via Electron Beam Melting
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *