Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-17T21:28:11.532Z Has data issue: false hasContentIssue false

Fundamental limit to single-atom analysis by STEM-EDX spectroscopy

Published online by Cambridge University Press:  04 August 2017

M. Watanabe
Affiliation:
Dept of Materials Science and Engineering, Lehigh University, Bethlehem. PA 18015.
R.F. Egerton
Affiliation:
Physics Department, University of Alberta, Edmonton, Canada T6G 2E1.

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Fu, Q., Saltsburg, H. & Flytzani-Stephanopoulos, M. Science 301 2003). p. 935.CrossRefGoogle Scholar
[2] Yang, M, et al, J. Am. Chem. Soc 135 2013). p. 3768.CrossRefGoogle Scholar
[3] Allard, LF, Duan, S. & Liu, J Microsc. Microanal 22(Suppl. 3 2016). p. 876.CrossRefGoogle Scholar
[4] Egerton, RF, et al, Ultramicroscopy 110 2010). p. 991.Google Scholar
[5] Seltzer, SM & Berger, M.J. Atomic Data & Nuclear Data Tables 35 1986). p. 345.Google Scholar
[6] Egerton, RF Microsc. Microanal 19 2013). p. 479.Google Scholar
[7] Suenaga, K, et al, Nature Photonics 6 2012). p. 545.Google Scholar
[8] Lovejoy, T, et al, Appl.Phys. Lett 100(2012), 154101.CrossRefGoogle Scholar
[9] MW wishes to acknowledge financial support from the NSF through grants DMR-0804528 and DMR-1040229. RFE is grateful to NSERC for funding.Google Scholar