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Focused Ne+ Beam for Improved SIMS Analysis of Lithium Ion Batteries

  • Fouzia Khanom (a1), U. Golla-Schindler (a2), Timo Bernthaler (a2), Gerhard Schneider (a2) and Brett Lewis (a1)...
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Corresponding author

*Corresponding author: fouzia.khanom@zeiss.com

References

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[1]Hlawacek, G and Gölzhäuser, A in “Helium Ion Microscopy”, (Springer, Switzerland).
[2]Wirtz, T, Vanhove, N, Pillatsch, L, Dowsett, D, Sijbrandij, S, and Notte, J, Appl. Phys. Lett. 101 (2012).
[3]Dowsett, D and Wirtz, T, Anal. Chem. 89 (2017), pp. 8957-8965.
[4]Wirtz, T, Philipp, P, Audinot, J-N, Dowsett, D, Eswara, S, Nanotechnology 26 (2015), p. 434001.
[5]Gratia, P, et al. , J. Am. Chem. Soc. 138 (2016), pp. 582115824.
[6]Gratia, P, et al. , ACS Energy Lett. 2 (2017), pp. 2686-2693.
[7]Vollnhals, F, et al. , Anal. Chem. 89 (2017), pp. 10702-10710.
[8]Golla-Schindler, U, Zeibig, D, Prickler, L, Behn, S, Bernthaler, T, Schneider, G, Micron 113 (2018), pp. 10-19.
[9]The authors from Aalen University want to acknowledge C. Guenther and M.A. Danzer for the samples and Federal Ministry for Economic Affairs and Energy (BMWi) Germany, for financial support

Focused Ne+ Beam for Improved SIMS Analysis of Lithium Ion Batteries

  • Fouzia Khanom (a1), U. Golla-Schindler (a2), Timo Bernthaler (a2), Gerhard Schneider (a2) and Brett Lewis (a1)...

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