Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Wan, KeShu
Sun, Wei
Tang, ChunKai
and
Rong, ZhiDan
2012.
Three-dimensional analysis of micro defect morphologies in cement-based materials using focused ion beam tomography.
Science China Technological Sciences,
Vol. 55,
Issue. 6,
p.
1539.
Davis, Joel
Short, Ken
Wuhrer, Richard
Phillips, Matthew R.
Lumpkin, Gregory R.
and
Whittle, Karl R.
2013.
Electron backscatter diffraction characterization of plasma immersion ion implantation effects in stainless steel.
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms,
Vol. 295,
Issue. ,
p.
38.
Giannuzzi, L.A.
and
Michael, J.R.
2013.
Comparison of Channeling Contrast between Ion and Electron Images.
Microscopy and Microanalysis,
Vol. 19,
Issue. 2,
p.
344.
Santeufemio, Christopher
Gorman, Brian P.
Zhou, Chuanzhen
Giannuzzi, Lucille A.
and
Stevie, Fred A.
2013.
TOF SIMS analyses of stray Ga during FIB milling.
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 31,
Issue. 6,
Parish, C.M.
Hijazi, H.
Meyer, H.M.
and
Meyer, F.W.
2014.
Effect of tungsten crystallographic orientation on He-ion-induced surface morphology changes.
Acta Materialia,
Vol. 62,
Issue. ,
p.
173.
Joy, D.C.
and
Michael, J.R.
2014.
Modeling ion-solid interactions for imaging applications.
MRS Bulletin,
Vol. 39,
Issue. 4,
p.
342.
Revelly, A.K.
Monpara, G.
Samajdar, I.
Krishna, K.V. Mani
Tewari, R.
Srivastava, D.
Dey, G.K.
and
Panwar, A.S.
2015.
Effect of Gallium ion damage on poly-crystalline Zirconium: Direct experimental observations and molecular dynamics simulations.
Journal of Nuclear Materials,
Vol. 467,
Issue. ,
p.
155.
Burnett, T.L.
Kelley, R.
Winiarski, B.
Contreras, L.
Daly, M.
Gholinia, A.
Burke, M.G.
and
Withers, P.J.
2016.
Large volume serial section tomography by Xe Plasma FIB dual beam microscopy.
Ultramicroscopy,
Vol. 161,
Issue. ,
p.
119.
Jones, H.G.
Day, A.P.
and
Cox, D.C.
2016.
Electron backscatter diffraction studies of focused ion beam induced phase transformation in cobalt.
Materials Characterization,
Vol. 120,
Issue. ,
p.
210.
Rice, Katherine P.
Chen, Yimeng
Prosa, Ty J.
and
Larson, David J.
2016.
Implementing Transmission Electron Backscatter Diffraction for Atom Probe Tomography.
Microscopy and Microanalysis,
Vol. 22,
Issue. 3,
p.
583.
Babu, R. Prasath
Irukuvarghula, S.
Harte, A.
and
Preuss, M.
2016.
Nature of gallium focused ion beam induced phase transformation in 316L austenitic stainless steel.
Acta Materialia,
Vol. 120,
Issue. ,
p.
391.
BRADLEY, R.S.
LIU, Y.
BURNETT, T.L.
ZHOU, X.
LYON, S.B.
WITHERS, P.J.
GHOLINIA, A.
HASHIMOTO, T.
GRAHAM, D.
GIBBON, S.R.
and
HORNBERGER, B.
2017.
Time‐lapse lab‐based x‐ray nano‐CT study of corrosion damage.
Journal of Microscopy,
Vol. 267,
Issue. 1,
p.
98.
Goldstein, Joseph I.
Newbury, Dale E.
Michael, Joseph R.
Ritchie, Nicholas W. M.
Scott, John Henry J.
and
Joy, David C.
2018.
Scanning Electron Microscopy and X-Ray Microanalysis.
p.
517.
Horák, Michal
Bukvišová, Kristýna
Švarc, Vojtěch
Jaskowiec, Jiří
Křápek, Vlastimil
and
Šikola, Tomáš
2018.
Comparative study of plasmonic antennas fabricated by electron beam and focused ion beam lithography.
Scientific Reports,
Vol. 8,
Issue. 1,
Mustafa, H.
Matthews, D.T.A.
and
Römer, G.R.B.E.
2019.
Investigation of the ultrashort pulsed laser processing of zinc at 515 nm: Morphology, crystallography and ablation threshold.
Materials & Design,
Vol. 169,
Issue. ,
p.
107675.
Kong, Charlie
Cheong, Soshan
and
Tilley, Richard D.
2019.
Comprehensive Nanoscience and Nanotechnology.
p.
327.
Thompson, Adam W.
Harris, Zachary D.
and
Burns, James T.
2019.
Examination of focused ion beam-induced damage during platinum deposition in the near-surface region of an aerospace aluminum alloy.
Micron,
Vol. 118,
Issue. ,
p.
43.
Ajantiwalay, Tanvi
Trowbridge, Tammy
Winston, Alexander
Sun, Cheng
Sridharan, Kumar
and
Aitkaliyeva, Assel
2019.
Best practices for preparing radioactive specimens for EBSD analysis.
Micron,
Vol. 118,
Issue. ,
p.
1.
Bera, Anup Kumar
and
Kumar, Dileep
2020.
In-Situ Investigation of Ion Beam-Induced Crossover in Uniaxial Magnetic Anisotropy of Polycrystalline Fe Films.
ACS Applied Electronic Materials,
Vol. 2,
Issue. 11,
p.
3686.
Schuler, Jennifer D.
Grigorian, Charlette M.
Barr, Christopher M.
Boyce, Brad L.
Hattar, Khalid
and
Rupert, Timothy J.
2020.
Amorphous intergranular films mitigate radiation damage in nanocrystalline Cu-Zr.
Acta Materialia,
Vol. 186,
Issue. ,
p.
341.