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Fixturing Options for Atom Probe Tomography
Published online by Cambridge University Press: 30 July 2020
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References
Larson, D. J., et al. “Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures.” Nanotechnology 10.1 (1999): 45.10.1088/0957-4484/10/1/010CrossRefGoogle Scholar
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