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First Auto-Magnifier Platform for Hardware Assurance and Reverse Engineering Integrated Circuits

Published online by Cambridge University Press:  05 August 2019

Ronald Wilson ,
Navid Asadizanjani ,
Domenic Forte  and
Damon L. Woodard
Ronald Wilson*
Affiliation:
Department of Electrical and Computer Engineering, University of Florida, Gainesville, USA
Navid Asadizanjani
Affiliation:
Department of Electrical and Computer Engineering, University of Florida, Gainesville, USA
Domenic Forte
Affiliation:
Department of Electrical and Computer Engineering, University of Florida, Gainesville, USA
Damon L. Woodard
Affiliation:
Department of Electrical and Computer Engineering, University of Florida, Gainesville, USA
*
*Corresponding author: ronaldwilson@ufl.edu

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 226 - 227
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Soden, Jerry M., and Anderson, Richard E.. “IC failure analysis: techniques and tools for quality reliability improvement.” Proceedings of the IEEE 81.5 (1993): 703-715.Google Scholar
[2]May, Gary S., and Spanos, Costas J.. Fundamentals of semiconductor manufacturing and process control. John Wiley & Sons, 2006:95-96Google Scholar
[3]Vashistha, N., Rahman, M. T., Shen, H., Woodard, D. L., Asadizanjani, N., & Tehranipoor, M. (2018). Detecting Hardware Trojans Inserted by Untrusted Foundry Using Physical Inspection and Advanced Image Processing. Journal of Hardware and Systems Security, 2(4), 333-344.Google Scholar
[4]Principe, E. L., Asadizanjani, Navid, Forte, Domenic, Tehranipoor, Mark, Chivas, Robert, DiBattista, Michael, Silverman, Scott, Marsh, Mike, Piche, Nicolas, and Mastovich, John. “Steps Toward Automated Deprocessing of Integrated Circuits.” ISTFA, 2017.Google Scholar