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First Application of Cc Corrected Imaging for High-Resolution and Energy-Filtered TEM

Published online by Cambridge University Press:  26 July 2009

B Kabius ,
P Hartel ,
M Haider ,
H Müller ,
S Uhlemann ,
U Loebau  and
J Zach
B Kabius
Affiliation:
Argonne National Laboratory
P Hartel
Affiliation:
CEOS GmbH,Germany
M Haider
Affiliation:
CEOS GmbH,Germany
H Müller
Affiliation:
CEOS GmbH,Germany
S Uhlemann
Affiliation:
CEOS GmbH,Germany
U Loebau
Affiliation:
CEOS GmbH,Germany
J Zach
Affiliation:
CEOS GmbH,Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 1456 - 1457
Copyright
Copyright © Microscopy Society of America 2009