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FIB TEM Cross-Section Sample Preparation of Thin Metal Films Deposited on Polymer Substrates

Published online by Cambridge University Press:  08 April 2017

F Rivera ,
J Abbott ,
R Davis  and
R Vanfleet
F Rivera
Affiliation:
Brigham Young University
J Abbott
Affiliation:
Brigham Young University
R Davis
Affiliation:
Brigham Young University
R Vanfleet
Affiliation:
Brigham Young University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 638 - 639
Copyright
Copyright © Microscopy Society of America 2011