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Experimental Method to Determine the Absolute Efficiency Curve of a Wavelength Dispersive Spectrometer

Published online by Cambridge University Press:  04 July 2008

Jorge Trincavelli ,
Silvina Limandri ,
Alejo Carreras  and
Rita Bonetto
Jorge Trincavelli*
Affiliation:
Facultad de Matemática, Astronomía y Física, Universidad Nacional de Córdoba, Ciudad Universitaria, 5000, Córdoba, Argentina Consejo Nacional de Investigaciones Científicas y Técnicas de la República Argentina, Ciudad Universitaria, 5000, Córdoba, Argentina
Silvina Limandri
Affiliation:
Facultad de Matemática, Astronomía y Física, Universidad Nacional de Córdoba, Ciudad Universitaria, 5000, Córdoba, Argentina Consejo Nacional de Investigaciones Científicas y Técnicas de la República Argentina, Ciudad Universitaria, 5000, Córdoba, Argentina
Alejo Carreras
Affiliation:
Consejo Nacional de Investigaciones Científicas y Técnicas de la República Argentina, Ciudad Universitaria, 5000, Córdoba, Argentina Instituto de Investigaciones en Tecnología Química, Universidad Nacional de San Luis, CC 290, 5700, San Luis, Argentina
Rita Bonetto
Affiliation:
Consejo Nacional de Investigaciones Científicas y Técnicas de la República Argentina, Ciudad Universitaria, 5000, Córdoba, Argentina Centro de Investigación y Desarrollo en Ciencias Aplicadas Dr. Jorge Ronco, Calle 47 No257; Facultad de Ciencias Exactas y Facultad de Ingeniería de laUNLP, 1900 La Plata, Argentina
*
Corresponding author. E-mail: jorge@quechua.fis.uncor.edu
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Abstract

A method for the experimental determination of the absolute efficiency of wavelength dispersive spectrometers was developed, based on the comparison of spectra measured with a wavelength dispersive system and with an energy dispersive spectrometer. The aim of studying this parameter arises because its knowledge is necessary to perform standardless analysis. A simple analytical expression was obtained for the efficiency curve for three crystals (TAP, PET, and LiF) of the spectrometer used, within an energy range from 0.77 to 10.83 keV. Although this expression is particular for the system used in this work, the method may be extended to other spectrometers and crystals for electron probe microanalysis and X-ray fluorescence.

Keywords

detection efficiencywavelength dispersive X-ray spectrometerelectron probe microanalysisstandardless microanalysis
Type
Microanalysis
Information
Microscopy and Microanalysis , Volume 14 , Issue 4 , August 2008 , pp. 306 - 314
Copyright
Copyright © Microscopy Society of America 2008

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References

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