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Examination of the Structural Quality of InAsSbBi Epilayers using Cross Section Transmission Electron Microscopy

  • Rajeev R. Kosireddy (a1), Stephen T. Schaefer (a2), Arvind J. Shalindar (a2), Preston T. Webster (a2) (a3) and Shane R. Johnson (a2)...
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Abstract

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References

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[1] Webster, P. T., et al, Appl. Phys. Lett 111 2017 082104.
[2] The authors gratefully acknowledge financial support through the National Science Foundation (NSF) award DMR-1410393 and the Air Force Office for Scientific Research (AFOSR) STTR Phase II grant FA9550-16-C-0021, as well as the use of facilities in the LeRoy Eyring Center for Solid State Science at Arizona State University.

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