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Evaluation of Tip Performance by XE-100 Atomic Force Microscopy (AFM)

Published online by Cambridge University Press:  24 July 2003

Jun S. Lee ,
Joonhyung Kwon ,
Sang-il Park  and
Changmo Sung
Jun S. Lee
Affiliation:
Center for Advanced Materials, University of Massachusetts, LowellMA 01854
Joonhyung Kwon
Affiliation:
PSIA Corporation, Seocho-dong 1600-3, Seoul 137-070, Korea
Sang-il Park
Affiliation:
PSIA Corporation, Seocho-dong 1600-3, Seoul 137-070, Korea
Changmo Sung
Affiliation:
Center for Advanced Materials, University of Massachusetts, LowellMA 01854

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 1240 - 1241
Copyright
Copyright © Microscopy Society of America 2003