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Energy Selected Secondary Electron Image Revealing Surface Potential by High Accelerating Voltage Scanning Electron Microscope

Published online by Cambridge University Press:  01 August 2018

Kei-ichi Fukunaga
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Noriaki Endo
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Shuji Kawai
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Takashi Suzuki
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Eiji Okunishi
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Yukihito Kondo
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
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Abstract

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Copyright
© Microscopy Society of America 2018 

References

[1] Tsurumi, D, Hamada, K Kawasaki, Y Japan J. Appl. Phys. 51 2012) p. 106503.CrossRefGoogle Scholar
[2] Venables, D Maher, DM J. Vac. Sci. Technol. B 14 1996) p. 421.CrossRefGoogle Scholar
[3] Sasaki, H, et al, Microscopy 63 2014) p. 235.CrossRefGoogle ScholarPubMed
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