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Energy Selected Secondary Electron Image Revealing Surface Potential by High Accelerating Voltage Scanning Electron Microscope

Published online by Cambridge University Press:  01 August 2018

Kei-ichi Fukunaga
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Noriaki Endo
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Shuji Kawai
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Takashi Suzuki
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Eiji Okunishi
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan
Yukihito Kondo
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

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[3] Sasaki, H, et al, Microscopy 63 2014) p. 235.Google Scholar