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Eliminating Decoherence Effects and Improving Reconstructed Image Quality in Soft X-ray Ptychography.

Published online by Cambridge University Press:  10 August 2018

Chunpeng Wang
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, CAS, Shanghai, China
Zijian Xu*
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, CAS, Shanghai, China
Haigang Liu
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, CAS, Shanghai, China
Xulei Tao
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, CAS, Shanghai, China
Renzhong Tai
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, CAS, Shanghai, China
*
* Corresponding author, xuzijian@sinap.ac.cn
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Abstract

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© Microscopy Society of America 2018 

References

[1] Faulkner, H. M. L. Rodenburg, J. M. Physical Review Letters 93 2004 023903.CrossRefGoogle Scholar
[2] Thibault, P., etal, Science 321 2008 379382.CrossRefGoogle Scholar
[3] Thibault, P. Menzel, A. Nature 494 2013 6871.CrossRefGoogle Scholar
[4] Li, P., et al, Optics Express 24(6 2016 90389052.CrossRefGoogle Scholar
[5] Batey, D. J., et al, Physical Review A 89 2014 043812.CrossRefGoogle Scholar
[6] Wang, C., et al, Nuclear Science and Techniques 28 2017 74.CrossRefGoogle Scholar
[7] Wang, C., et al, Applied Optics 56(8 2017 20992111.CrossRefGoogle Scholar
[8] Xu, Z., et al, Journal of Physics: Conference Series 849(1 2017 012033.Google Scholar
[9] Maiden, A. M. Rodenburg, J. M. Ultramicroscopy 109 2009 12561262.CrossRefGoogle Scholar
[10] The authors acknowledge funding from the National Natural Science Foundation of China (grant Nos. 11705273, 11575283, 11505277).Google Scholar
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