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Eliminating Decoherence Effects and Improving Reconstructed Image Quality in Soft X-ray Ptychography.

Published online by Cambridge University Press:  10 August 2018

Chunpeng Wang ,
Zijian Xu ,
Haigang Liu ,
Xulei Tao  and
Renzhong Tai
Chunpeng Wang
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, CAS, Shanghai, China
Zijian Xu*
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, CAS, Shanghai, China
Haigang Liu
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, CAS, Shanghai, China
Xulei Tao
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, CAS, Shanghai, China
Renzhong Tai
Affiliation:
Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, CAS, Shanghai, China
*
* Corresponding author, xuzijian@sinap.ac.cn

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 42 - 43
Copyright
© Microscopy Society of America 2018 

References

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[10] The authors acknowledge funding from the National Natural Science Foundation of China (grant Nos. 11705273, 11575283, 11505277).Google Scholar