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Elfs: Energy Loss Fine Structure Analysis in Materials

Published online by Cambridge University Press:  02 July 2020

Mehmet Sarikaya ,
Maoxu Qian  and
Edward A. Stern
Mehmet Sarikaya
Affiliation:
Materials Science and Engineering and, University of Washington, Seattle, WA98195
Maoxu Qian
Affiliation:
Materials Science and Engineering and, University of Washington, Seattle, WA98195
Edward A. Stern
Affiliation:
Physics, University of Washington, Seattle, WA, 98195
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ELFS (energy loss fine structure), similar to XAFS (x-ray absorption fine structure) provides short-range order atomic structural information of crystalline and amorphous materials. Although known quite sometime, ELFS spectroscopy only until recently has gained importance, mainly due new developments in spectrometer and TEM designs, spectra acquisition and interpretation techniques. This paper focuses on some new developments in the acquisition, interpretation, and the use of the extended regime of the ELFS spectroscopy.

Although fine structure spectroscopy in EELS and its similarity to XAFS were recognized sometime ago, ELFS has only seen limited use mainly because of insufficient spectral statistics, various systematic errors and drifts, and the absence of sophisticated software that faithfully uses the XAFS software and incorporates the latest advances in modeling theory. We have systematically improved the data acquisition technique and developed ELFS data analysis procedure which utilizes the sophisticated UWXAFS data analysis software package8 after correction of the differences between ELFS and XAFS data.

Type
Analytical Electron Microscopy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 953 - 954
Copyright
Copyright © Microscopy Society of America 1997

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References

1. Stern, E. A., Optic, 61, 45 (1982).Google Scholar

2. Leapman, R. D. and Cosslett, V. E., J. Phys. D, 9L, 29 (1976).CrossRefGoogle Scholar

3. Csillag, S., Johnson, D. A., and Stern, E. A., in EXAFS Spectroscopy Techniques and Applications, Teo, B. K. and Joy, D. C. (eds.) (Plenum, New York, 1981) pp. 241–254CrossRefGoogle Scholar

4. Qian, M., Sarikaya, M., and Stern, E. A., Ultramicroscopy, 59, 137 (1995).CrossRefGoogle Scholar

5. Sarikaya, M., Qian, M., and Stern, E. A., a review paper to appear in Micron (1997).Google Scholar

6. Rehr, J. J. et al., Phys. Rev. Lett., 69, 3397 (1992).CrossRefGoogle Scholar

7. Qian, M., Sarikaya, M., and Stern, E. A., to appear in Ultramicroscopy (1997).Google Scholar

8. UWXAFS-2 Software (Contact: E. A. Stern).Google Scholar

9. UWELFS-1 Software(Contact: M. Sarikaya).Google Scholar