No CrossRef data available.
Article contents
Elemental Mapping of Materials Using Omega Filter and Imaging Plate
Published online by Cambridge University Press: 02 July 2020
Extract
Elemental microanalysis has been important in materials characterization, since the elemental distribution strongly affects the property of various materials. A recently developed post-column energy filter coupled with a slow scan CCD camera makes it possible to carry out elemental mapping with a transmission electron microscope. Here, we develop the elemental mapping technique utilizing the omega filter and imaging plates (3760x3000 pixels). Since the data obtained from the imaging plates consist of a large number of pixels, fine and detailed elemental analysis will be expected.
Energy-filtered images were obtained by a JEM-2010 electron microscope installed with an omega-type energy filter, and they were recorded on imaging plates (FDL-UR-V:25 μm/pixel). The width of an energy-selecting slit was set to be 20 eV. Elemental maps were obtained from the energy-filtered images using the three window technique. Special care was taken to reduce the image shifts among the three filtered images used in the three-window method.
- Type
- Electron Energy-Loss Spectroscopy (EELS) and Imaging
- Information
- Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 216 - 217
- Copyright
- Copyright © Microscopy Society of America