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Electronic Structure Characterization of the Bi-YIG by EELS-STEM

Published online by Cambridge University Press:  05 August 2019

N. Herrera-Pineda*
Affiliation:
Facultad de Ciencias Químicas, Universidad Autónoma de Chihuahua, Circuito Universitario s/n campus II, Chihuahua, Chih. 31125, Mexico.
M. García-Guaderrama
Affiliation:
Laboratorio de Materiales y Sistemas Fotosensibles, CUCEI, Universidad de Guadalajara, Av. José Guadalupe Zuno # 48, Industrial los Belenes, Zapopan, Jalisco 45100, Mexico.
G. Herrera-Pérez*
Affiliation:
Catedrático CONACyT, Centro de Investigación en Materiales Avanzados S. C. Miguel de Cervantes 120, Chihuahua, Chih. 31136, México.
M. E. Fuentes-Montero
Affiliation:
Facultad de Ciencias Químicas, Universidad Autónoma de Chihuahua, Circuito Universitario s/n campus II, Chihuahua, Chih. 31125, Mexico.
J. M. Napóles-Duarte
Affiliation:
Facultad de Ciencias Químicas, Universidad Autónoma de Chihuahua, Circuito Universitario s/n campus II, Chihuahua, Chih. 31125, Mexico.
J. P. Palomares-Baez
Affiliation:
Facultad de Ciencias Químicas, Universidad Autónoma de Chihuahua, Circuito Universitario s/n campus II, Chihuahua, Chih. 31125, Mexico.
C. Ornelas-Gutierrez
Affiliation:
Laboratorio Nacional de Nanotecnología, Centro de Investigación en Materiales Avanzados S. C. Miguel de Cervantes 120, Chihuahua, Chih. 31136, México.
R. Ochoa-Gamboa
Affiliation:
Laboratorio Nacional de Nanotecnología, Centro de Investigación en Materiales Avanzados S. C. Miguel de Cervantes 120, Chihuahua, Chih. 31136, México.
W. Antunez-Flores
Affiliation:
Laboratorio Nacional de Nanotecnología, Centro de Investigación en Materiales Avanzados S. C. Miguel de Cervantes 120, Chihuahua, Chih. 31136, México.
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Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zhao, H, Zhou, J, Bai, Y, Gui, Z, and Li, L, J. Magn. Magn. Mater. 280 (2004), 208213.CrossRefGoogle Scholar
[2]Ishibashi, T, Kosaka, T, Naganuma, M and Nomura, T, J. Phys. Conf. Ser. 200 (2010), 112002.CrossRefGoogle Scholar
[3]Stavitski, E and de Groot, F M F, Micron, 41 (2010) 687-694CrossRefGoogle Scholar
[4]Durán, A, et al. , J. Appl. Phys. 122 (2017), 134101.CrossRefGoogle Scholar
[5]Schneider, C A, Rasband, W S and Eliceiri, K W, Nature Methods 9 (2012), 671-675.CrossRefGoogle Scholar
[6]Lábár, J L, Ultramicroscopy, 103 (2005), 237-249.CrossRefGoogle Scholar
[7]Pattrick, R A D, et al. , Eur. J. Mineral. 14 (2002),10951102.CrossRefGoogle Scholar
[8]N Herrera thanks for the CONACyT PhD scholarship. G Herrera-Pérez acknowledge funding from the Basic Research Project 2015 CONACyT-SEP Grant No. 253605, Cátedra CONACyT Grant No. 2563 and CONACyT-SNI 1 support.Google Scholar
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