Hostname: page-component-78c5997874-94fs2 Total loading time: 0 Render date: 2024-11-18T15:16:07.824Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Ptychography: From 2D to 3D Reconstructions

Published online by Cambridge University Press:  04 August 2017

Si Gao ,
Fucai Zhang ,
A. I. Kirkland ,
Xiaoqing Pan  and
Peng Wang
Si Gao
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China.
Fucai Zhang
Affiliation:
Research Complex at Harwell, Harwell Oxford Campus, Didcot, UK. London Centre for Nanotechnology, London, UK. Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China.
A. I. Kirkland
Affiliation:
Research Complex at Harwell, Harwell Oxford Campus, Didcot, UK. Department of Materials, University of Oxford, Parks Road, Oxford, UK. Electron Physical Sciences Imaging Centre, Diamond Lightsource, Diamond House, Oxfordshire, Didcot, UK
Xiaoqing Pan
Affiliation:
Department of Physics and Astronomy, University of California, Irvine, CA, USA
Peng Wang
Affiliation:
National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, People's Republic of China.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 346 - 347
Copyright
© Microscopy Society of America 2017 

References

[1] Gerchberg, R & Saxton, WO, Optik 35 (1972). p. 237.Google Scholar
[2] D'Alfonso, AJ, et al, Physical Review B 89 (2014). p. 064101.Google Scholar
[3] Maiden, AM & Rodenburg, JM, Ultramicroscopy 109 (2009). p. 1256.CrossRefGoogle Scholar
[4] Maiden, AM, Humphry, MJ & Rodenburg, JM, Journal of the Optical Society of America a-Optics Image Science and Vision 29 (2012). p. 1606.Google Scholar
[5] Suzuki, A, Furutaku, S, Shimomura, K, et al, Physical Review Letters 112 (2014). p. 053903.Google Scholar
[6] The authors acknowledge funding from the National Natural Science Foundation of China (11474147), the National Basic Research Program of China, (Grant No. 2015CB654900) and the International Science & Technology Cooperation Program of China (2014DFE00200).Google Scholar