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Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray Lines – ERRATUM

Published online by Cambridge University Press:  15 December 2016

Xavier Llovet ,
Philippe T. Pinard ,
Erkki Heikinheimo ,
Seppo Louhenkilpi  and
Silvia Richter

Abstract

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Type
Erratum
Information
Microscopy and Microanalysis , Volume 22 , Issue 6 , December 2016 , pp. 1389
Copyright
© Microscopy Society of America 2016 

doi:http://dx.doi.org/10.1017/S1431927616011831, Published by Cambridge University Press, 26 October 2016.

A typographical error was published in an equation on p. 8 of “Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray Lines” by Llovet et al. (Reference Llovet, Pinard, Heikinheimo, Louhenkilpi and Richter2016), whereby a “1” was mistakenly input as a “0”. The corrected sentence and equation is published below:

Notice that ωL2+a L2+f 23=1, where a L2 is the Auger yield for the L2 subshell.

We apologize for this error.

References

Llovet, X., Pinard, P.T., Heikinheimo, E., Louhenkilpi, S. & Richter, S. (2016). Electron probe microanalysis of Ni silicides using Ni-L X-ray lines. Microsc Microanal 22, doi:http://dx.doi.org/10.1017/S1431927616011831.Google ScholarPubMed