Hostname: page-component-7bb8b95d7b-495rp Total loading time: 0 Render date: 2024-09-18T19:34:12.971Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Microprobe Analysis of Minor and Trace Elements in Beam Sensitive Materials: How Far Can We Go?

Published online by Cambridge University Press:  05 August 2019

Julien M. Allaz ,
Razvan-Gabriel Popa ,
Eric Reusser  and
Lukas Martin
Julien M. Allaz*
Affiliation:
ETH Zürich, Department of Earth Sciences, Zurich, Switzerland.
Razvan-Gabriel Popa
Affiliation:
ETH Zürich, Department of Earth Sciences, Zurich, Switzerland.
Eric Reusser
Affiliation:
ETH Zürich, Department of Earth Sciences, Zurich, Switzerland.
Lukas Martin
Affiliation:
NAGRA, Wettingen, Switzerland.
*
*Corresponding author: julien.allaz@erdw.ethz.ch

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2312 - 2313
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Fialin, M et al. , American Mineralogist 84 (1999), p. 70-77.Google Scholar
[2]Jercinovic, MJ et al. , IOP Conference Series: Materials Science and Engineering 32 (2012), 012012.Google Scholar
[3]Popa, RG et al. , Journal of Volcanology and Geothermal Research (under review).Google Scholar
[4]Webster, JD et al. , American Mineralogist 100 (2015), p. 522-535.Google Scholar
[5]Stock, MJ et al. , Nature Geosciences 9 (2016), p. 249-255.Google Scholar
[6]Donovan, J and Tingle, TN, Journal of Microscopy and Microanalysis 2 (1996), p. 1-7.Google Scholar
[7]Goloff, B, Webster, JD and Harlov, D, American Mineralogist 97 (2012), p. 1103–15.Google Scholar