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Effect of substrate morphology on stress-tested GaN-on-GaN vertical p-n diodes

Published online by Cambridge University Press:  30 July 2021

Prudhvi Ram peri
Affiliation:
Arizona State University, tempe, Arizona, United States
Kai Fu
Affiliation:
arizona state university, United States
Houqiang Fu
Affiliation:
Arizona State University, United States
Yuji Zhao
Affiliation:
Arizona State University, United States
David J Smith
Affiliation:
Arizona State University, 85281, Arizona, United States

Abstract

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Type
Defects in Materials: How We See and Understand Them
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Peri, P., Fu, K., Fu, H., Zhao, Y., and Smith, D. J., J. Electron. Mater. (2021).Google Scholar
Peri, P., Fu, K., Fu, H., Zhao, Y., and Smith, D. J., J. Vac. Sci. Technol. A 38, 063402 (2020).Google Scholar