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The Effect of a Pulsed Electron Beam on Damage Threshold

Published online by Cambridge University Press:  01 August 2018

Elisah J. VandenBussche  and
David J. Flannigan
Elisah J. VandenBussche
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, USA
David J. Flannigan
Affiliation:
Department of Chemical Engineering and Materials Science, University of Minnesota, Minneapolis, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2002 - 2003
Copyright
© Microscopy Society of America 2018 

References

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[10] This material is based upon work supported by the National Science Foundation Graduate Research Fellowship Program under Grant No. 00039202 and by the Arnold and Mabel Beckman Foundation in the form of a Beckman Young Investigator Award.Google Scholar