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Dynamic Secondary Ion Mass Spectrometry (SIMS) Imaging of Materials for the Nuclear Industry: Historical Perspectives and Recent Advances

Published online by Cambridge University Press:  04 August 2017

G. McMahon ,
B.D. Miller  and
M.G. Burke
G. McMahon
Affiliation:
University of Manchester, School of Materials, ManchesterUK
B.D. Miller
Affiliation:
Naval Nuclear Laboratory, West Mifflin PA, USA
M.G. Burke
Affiliation:
University of Manchester, Materials Performance Centre, ManchesterUK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 2208 - 2209
Copyright
© Microscopy Society of America 2017 

References

References:

1. Castaing, R. & Slodzian, G. J Microsc 1 1962 p31–38.Google Scholar
2. Slodzian, G., et al, Biol Cell 74 1992 p43–50.Google Scholar
3. Burke, M.G., Hyatt, B.Z. & McMahon, G. Microscopy and Microanalysis 5 1999 p862–863.Google Scholar
4. McMahon, G., Miller, B.D. & Burke, M.G. submitted 2017.Google Scholar