Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-18T08:41:30.970Z Has data issue: false hasContentIssue false
  • English
  • Français

Dynamic Electron and X-ray Imaging is a Moving Experience

Published online by Cambridge University Press:  30 July 2021

Simon Burgess ,
Haithem Mansour ,
Anthony Hyde ,
Philippe Pinard ,
Peter Statham ,
Christian Lang  and
Michael Hjelmstad
Simon Burgess
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Haithem Mansour
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, England, United Kingdom
Anthony Hyde
Affiliation:
Oxford Instruments, England, United Kingdom
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Peter Statham
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, United Kingdom
Christian Lang
Affiliation:
Oxford Instruments Nanoanalysis, High Wycombe, England, United Kingdom
Michael Hjelmstad
Affiliation:
Oxford Instruments Inc, Pleasanton, California, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1840 - 1841
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Pinard, P. et al. Microsc. Microanal. 24 S1 (2018), p. 624.CrossRefGoogle Scholar
Hyde, A. et al. Microsc. Microanal. 25 S2 (2019), p, 1276CrossRefGoogle Scholar