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Double-Slit Electron Interference Experiment with Phase Modulation

Published online by Cambridge University Press:  30 July 2020

Ken Harada
Affiliation:
RIKEN, Hatoyama, Saitama, Japan
Yoshio Takahashi
Affiliation:
Hitachi, Ltd., Hatoyama, Saitama, Japan
Tetsuya Akashi
Affiliation:
Hitachi, Ltd., Hatoyama, Saitama, Japan
Yoshimasa Ono
Affiliation:
RIKEN, Hatoyama, Saitama, Japan
Tetsuji Kodama
Affiliation:
Meijo University, Nagoya, Aichi, Japan
Shigeo Mori
Affiliation:
Osaka Prefecture University, Sakai, Osaka, Japan

Abstract

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Type
Direct Phase Imaging with Coherent Electron Beam in TEM
Copyright
Copyright © Microscopy Society of America 2020

References

Akashi, T. et al. , Appl. Phys. Lett., 106 (2015) 074101.10.1063/1.4908175CrossRefGoogle Scholar
Harada, K. et al. , Scientific Reports, 8 (2018) 1008.10.1038/s41598-018-19380-4CrossRefGoogle Scholar
Harada, K. et al. , Microsc. Microanal., 24 (2018) 1966.10.1017/S1431927618010310CrossRefGoogle Scholar
Harada, K. et al. , Microsc. Microanal., 25 (2019) 944.10.1017/S1431927619005452CrossRefGoogle Scholar
Harada, K. et al. , Appl. Phys. Lett., 84 (2004) 3229.10.1063/1.1715155CrossRefGoogle Scholar
The authors thank Ms. K. Shimada of RIKEN for preparing the V-shaped slits. This work was supported by KAKENHI, Grant-in-Aid for Scientific Research ((B) 18H03475).Google Scholar
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