Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Sasaki, Takeo
Sawada, Hidetaka
Okunishi, Eiji
Jimbo, Yu
Iwasawa, Yorinobu
Miyatake, Koji
Yuasa, Shuichi
and
Kaneyama, Toshikatsu
2015.
Improving Analytical Efficiency of EDS using a Newly-designed X-ray Detecting System for Aberration Corrected 300 kV Microscope.
Microscopy and Microanalysis,
Vol. 21,
Issue. S3,
p.
1861.
Fukunaga, Kei-ichi
Endo, Noriaki
Suzuki, Minoru
Asayama, Kyoichiro
and
Kondo, Yukihito
2015.
B11-P-04Limit of Detection for Dopant in Si Using Large Solid Angle Silicon Drift Detector.
Microscopy,
Vol. 64,
Issue. suppl 1,
p.
i79.2.
Fukunaga, K.
Endo, N.
Suzuki, M.
and
Kondo, Y.
2015.
Concentration at Detection Limit of Dopant for Semiconductor Samples Using Dual SDD Analysis System.
Microscopy and Microanalysis,
Vol. 21,
Issue. S3,
p.
823.
Ishikawa, Takaki
Okunishi, Eiji
Kaneyama, Toshikatsu
Kondo, Yukihito
and
Matsumura, Syo
2015.
Aberration Corrected Electron Microscopy Enhanced for Lower Accelerating Voltages.
Microscopy and Microanalysis,
Vol. 21,
Issue. S3,
p.
1599.
Lin, C. C.
Chen, S. Y.
Wang, J.
and
Hsieh, C. L.
2015.
Highly accurate TEM/EDS analysis to identify the stack oxide-nitride-oxide structure of advanced NAND flash products.
p.
193.
Okunishi, Eiji
and
Kondo, Yukihito
2016.
Pseudo Atomic Column EELS & EDS Mapping of Silicon Reconstructed With K and L Electrons Using STEM-Moiré Method.
Microscopy and Microanalysis,
Vol. 22,
Issue. S3,
p.
264.
Motomura, Shunichi
Hara, Toru
Omori, Toshihiro
Kainuma, Ryosuke
and
Nishida, Minoru
2016.
Morphological and chemical analysis of bainite in Cu–17Al–11Mn (at.%) alloys by using orthogonal FIB-SEM and double-EDS STEM.
Microscopy,
Vol. 65,
Issue. 3,
p.
243.
Zanaga, Daniele
Altantzis, Thomas
Polavarapu, Lakshminarayana
Liz‐Marzán, Luis M.
Freitag, Bert
and
Bals, Sara
2016.
A New Method for Quantitative XEDS Tomography of Complex Heteronanostructures.
Particle & Particle Systems Characterization,
Vol. 33,
Issue. 7,
p.
396.
Zanaga, Daniele
Altantzis, Thomas
Sanctorum, Jonathan
Freitag, Bert
and
Bals, Sara
2016.
An alternative approach for ζ-factor measurement using pure element nanoparticles.
Ultramicroscopy,
Vol. 164,
Issue. ,
p.
11.
Kondo, Yukihito
Fukunaga, Kei-ichi
Okunishi, Eiji
and
Endo, Noriaki
2017.
Way to Reduce Electron Dose in Pseudo Atomic Column Elemental Maps by 2D STEM Moire Method.
Microscopy and Microanalysis,
Vol. 23,
Issue. S1,
p.
1790.
Ohnishi, Ichiro
Suzuki, Toshihiro
Miyatake, Kouji
Jimbo, Yu
Iwasawa, Yorinobu
Morita, Masaki
Sasaki, Takeo
Sawada, Hidetaka
and
Okunishi, Eiji
2018.
Analytical and <i>in situ</i> Applications Using Aberration Corrected Scanning Transmission Electron Microscope.
e-Journal of Surface Science and Nanotechnology,
Vol. 16,
Issue. 0,
p.
286.
Xu, W.
Dycus, J.H.
and
LeBeau, J.M.
2018.
Numerical modeling of specimen geometry for quantitative energy dispersive X-ray spectroscopy.
Ultramicroscopy,
Vol. 184,
Issue. ,
p.
100.
Hashiguchi, Hiroki
Sagawa, Ryusuke
Okunishi, Eiji
Endo, Noriaki
and
Kondo, Yukihito
2018.
Atomic Resolution Imaging and Analysis of Graphene at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun.
Microscopy and Microanalysis,
Vol. 24,
Issue. S1,
p.
128.
Ii, Seiichiro
2024.
Quantitative Characterization by Transmission Electron Microscopy and Its Application to Interfacial Phenomena in Crystalline Materials.
Materials,
Vol. 17,
Issue. 3,
p.
578.