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Dose-efficient strain mapping with high precision and throughput using cepstral transforms on 4D-STEM data

Published online by Cambridge University Press:  30 July 2021

K. P. Harikrishnan
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States
Dasol Yoon
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA, United States
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithac, New York, United States
Luigi Mele
Affiliation:
Materials and Structural Analysis Division, Thermo Fisher Scientific, Achtseweg Noord, Eindhoven, 5651 GG, Netherlands, Netherlands
Christoph Mitterbauer
Affiliation:
Materials and Structural Analysis Division, Thermo Fisher Scientific, Achtseweg Noord, Eindhoven, 5651 GG, Netherlands, Netherlands
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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