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Dose-efficient strain mapping with high precision and throughput using cepstral transforms on 4D-STEM data

Published online by Cambridge University Press:  30 July 2021

K. P. Harikrishnan ,
Dasol Yoon ,
Yu-Tsun Shao ,
Luigi Mele ,
Christoph Mitterbauer  and
David Muller
K. P. Harikrishnan
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States
Dasol Yoon
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA, United States
Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithac, New York, United States
Luigi Mele
Affiliation:
Materials and Structural Analysis Division, Thermo Fisher Scientific, Achtseweg Noord, Eindhoven, 5651 GG, Netherlands, Netherlands
Christoph Mitterbauer
Affiliation:
Materials and Structural Analysis Division, Thermo Fisher Scientific, Achtseweg Noord, Eindhoven, 5651 GG, Netherlands, Netherlands
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1994 - 1996
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Padgett, E., et al. , Ultramicroscopy 214, 112994 (2020).CrossRefGoogle Scholar
Tate, M. W., et al. , Microsc. Microanal. 22, 237 (2016).CrossRefGoogle Scholar
Yuan, R., et al. , Ultramicroscopy 207, 112837 (2019).CrossRefGoogle Scholar
Müller, K., et al. , Appl. Phys. Lett. 101, 212110 (2012).Google Scholar
Ozdol, V. B., et al. , Appl. Phys. Lett. 106, 253107.1 (2015).CrossRefGoogle Scholar
Cooper, D., et al. , Nano Lett. 15, 5289 (2015).CrossRefGoogle Scholar