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Dopant Quantification by Atomic-scale Energy Dispersive X-ray Analysis

Published online by Cambridge University Press:  23 September 2015

Zhen Chen
Affiliation:
School of Physics and Astronomy, Monash University, Victoria 3800, Australia
Scott D. Findlay
Affiliation:
School of Physics and Astronomy, Monash University, Victoria 3800, Australia
Matthew Weyland
Affiliation:
Monash Centre for Electron Microscopy, Monash University, Victoria 3800, Australia Department of Materials Engineering, Monash University, Victoria 3800, Australia
Adrian J. D'Alfonso
Affiliation:
School of Physics, University of Melbourne, Victoria 3010, Australia
Leslie J. Allen
Affiliation:
School of Physics, University of Melbourne, Victoria 3010, Australia
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Abstract

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Copyright © Microscopy Society of America 2015 

References

[1] D'Alfonso, AJ, et al, Physical Review B 81 (2010) 100101.CrossRefGoogle Scholar
[2] Kotula, PG, et al, Microscopy and Microanalysis 18 (2012). p 691698.CrossRefGoogle Scholar
[3] Kothleitner, G, et al, Physical Review Letters 112 (2014) 085501.CrossRefGoogle Scholar
[4] Chen, Z, et al, Submitted for publication (2014).Google Scholar
[5] Carlino, E & Grillo, V, Physical Review B 71 (2005) 235303.CrossRefGoogle Scholar
[6] The authors wish to thank Jenny Wong-Leung and Jenny Nian-Jiang from the Australian National University for the nanowire specimens and acknowledge support from the Australian Research Council's Discovery Projects funding scheme (Projects DP110102228 and DP140102538) and DECRA funding scheme (Project DEI30100739).Google Scholar
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