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Distortion Correction in Scanning Transmission Electron Microcopy with Controllable Scanning Pathways

Published online by Cambridge University Press:  25 July 2016

Xiahan Sang
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Andrew R. Lupini
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
Raymond R. Unocic
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Tricia L. Meyer
Affiliation:
Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
Thomas Z. Ward
Affiliation:
Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
Ho Nyung Lee
Affiliation:
Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
Eirik Endeve
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN Computer Science and Mathematics, Oak Ridge National Laboratory, Oak Ridge, TN
Richard K. Archibald
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN Computer Science and Mathematics, Oak Ridge National Laboratory, Oak Ridge, TN
Albina Y. Borisevich
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN Materials Sciences and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
Sergei V. Kalinin
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN
Stephen Jesse
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Sang, X. & LeBeau, J. M. Ultramicroscopy 138 (2014). p. 28.Google Scholar
[2] Jesse, S., et al., Small 44 (2015). p. 5895.Google Scholar
[3] Research supported by Oak Ridge National Laboratory’s (ORNL) Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy (DOE), Office of Science User Facility (XS, RRU, SK, SJ), and by ORNL’s Laboratory Directed Research and Development Program, which is managed by UT-Battelle LLC for the U.S. DOE (SJ), and by Office of Advanced Scientific Computing Research, Applied Mathematics program under the ACUMEN project. Film growth supported by the U.S. DOE, Office of Basic Energy Sciences, Materials Sciences and Engineering Division.Google Scholar