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Direct Imaging of Oxygen Sub-lattice Deformation in Li-rich Cathode Material Using Electron Ptychography

Published online by Cambridge University Press:  30 July 2021

Weixin Song
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Miguel Osorio
Affiliation:
University of Oxford, United States
John Marie
Affiliation:
University of OXFORD, United States
Emanuela Liberti
Affiliation:
The Rosalind Franklin Institute, Harwell Campus, United Kingdom
Xiaonan Luo
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Colum O'Leary
Affiliation:
University of California, Berkeley, United States
Robert House
Affiliation:
University of Oxford, United States
Peter Bruce
Affiliation:
University of Oxford, United States
Peter Nellist
Affiliation:
University of Oxford, Department of Materials, United States

Abstract

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Type
Microscopy & Spectroscopy of Energy Conversion and Storage Materials
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

House, R. A.; Rees, G. J.; Pérez-Osorio, M. A.; Marie, J.-J.; Boivin, E.; Robertson, A. W.; Nag, A.; Garcia-Fernandez, M.; Zhou, K.-J.; Bruce, P. G., Nature Energy 2020, 5 (10), 777-785.CrossRefGoogle Scholar
Liberti, E., et al. , Ultramicroscopy 2019, 210, 112914.CrossRefGoogle Scholar
Yang, H.; MacLaren, I.; Jones, L.; Martinez, G. T.; Simson, M.; Huth, M.; Ryll, H.; Soltau, H.; Sagawa, R.; Kondo, Y.; Ophus, C.; Ercius, P.; Jin, L.; Kovács, A.; Nellist, P. D., Ultramicroscopy 2017, 180, 173-179.CrossRefGoogle Scholar
Lozano, J. G.; Martinez, G. T.; Jin, L.; Nellist, P. D.; Bruce, P. G., Nano Lett 2018, 18 (11), 6850-6855.CrossRefGoogle Scholar
Jones, L.; Yang, H.; Pennycook, T. J.; Marshall, M. S. J.; Van Aert, S.; Browning, N. D.; Castell, M. R.; Nellist, P. D., Advanced Structural and Chemical Imaging 2015, 1 (1), 8.Google Scholar
The authors acknowledge use of characterization facilities within the David Cockayne Centre for Electron Microscopy, Department of Materials, University of Oxford and in particular the Faraday Institution (FIRG007, FIRG008), the EPSRC (EP/K040375/1 “South of England Analytical Electron Microscope”) and additional instrument provision from the Henry Royce Institute (Grant reference EP/R010145/1).Google Scholar