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Direct Electromagnetic Structure Observation by Aberration-corrected Differential Phase Contrast Scanning Transmission Electron Microscopy

  • N. Shibata (a1), S.D. Findlay (a2), T. Matsumoto (a1), T. Seki (a1), G. Sánchez-Santolino (a1), Y. Kohno (a3), H. Sawada (a3), H. Sasaki (a4), Y.G. So (a5), R. Ishikawa (a1) and Y. Ikuhara (a1) (a6)...
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References

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[1] Shibata, N., et al., J. Electron Microscopy 59, 473479, 2010.
[2] Dekkers, N.H. & de Lang, H. Optik 41, 452 (1974).
[3] Rose, H. Ultramicroscopy 2, 251 (1977).
[4] Stewart, W.C. J. Opt. Soc. Am. 66, 813 (1976).
[5] Shibata, N., et al., Sci. Rep. 5, 10040 (2015).
[6] Matsumoto, T., et al., Sci. Adv 2, e1501280 (2016).
[7] Close, R., et al., Ultramicroscopy 159, 124137, 2015.
[8] Shibata, N., et al., Nature Phys. 8, 611615, 2012.
[9] This work was supported by the PRESTO and SENTAN, JST and the JSPS KAKENHI Grant number 26289234. A part of this work was supported by Grant-in-Aid for Scientific Research on Innovative Areas (25106003). A part of this work was conducted in Research Hub for Advanced Nano Characterization, The University of Tokyo, under the support of “Nanotechnology Platform” (project No.12024046) by MEXT, Japan. This research was supported under the Discovery Projects funding scheme of the Australian Research Council (Projects No. DP110101570 and DP160102338 ).

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