Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-06-21T03:36:01.090Z Has data issue: false hasContentIssue false
  • English
  • Français

Digital Camera System in Transmission Electron Microscope

Published online by Cambridge University Press:  05 August 2019

Cheolsu Han ,
Jong-Man Jeung ,
Jin-Gyu Kim  and
Sang-Chul Lee
Cheolsu Han*
Affiliation:
Korea Basic Science Institute, Daejeon, Republic of Korea.
Jong-Man Jeung
Affiliation:
Korea Basic Science Institute, Daejeon, Republic of Korea.
Jin-Gyu Kim
Affiliation:
Korea Basic Science Institute, Daejeon, Republic of Korea.
Sang-Chul Lee
Affiliation:
Korea Basic Science Institute, Daejeon, Republic of Korea.
*
*Corresponding author: cshan72@kbsi.re.kr

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Vendor Symposium
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 546 - 547
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Williams, DB et al. , in “Transmission Electron Microscopy: A Textbook for Materials Science”, (Springer) Ch.7.Google Scholar
[2]Fan, GY and Ellisman, MH, Journal of Microscopy 200 (2000), p. 1.Google Scholar
[3]Vulovic, M et al. , Cryst., D66 (2010), p. 97.Google Scholar
[4]This research was supported by Korea Basic Science Institute Grant No.(D39612).Google Scholar