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Diffraction imaging of organic materials in extreme environments

Published online by Cambridge University Press:  30 July 2021

Yujun Xie
Affiliation:
Department of Nuclear Engineering, University of California, Berkeley, Berkeley 94720, USA, emeryville, California, United States
Ruopeng Zhang
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley94720, USA, United States
Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, California, United States
Andrew Minor
Affiliation:
UC Berkeley, Berkeley, California, United States
Haimei Zheng
Affiliation:
Lawrence Berkeley National Laboratory, United States
Peter Ercius
Affiliation:
Lawrence Berkeley National Laboratory, United States
Peter Hosemann
Affiliation:
University of California, Berkeley, United States

Abstract

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Type
Diffraction Imaging Across Disciplines
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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Panova, Ouliana, et al. "Diffraction imaging of nanocrystalline structures in organic semiconductor molecular thin films." Nature materials 18.8 (2019): 860-865.CrossRefGoogle Scholar
Bousige, Colin, et al. "Realistic molecular model of kerogen's nanostructure." Nature materials 15.5 (2016): 576-582.Google Scholar