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Differential Electron Scattering Cross-Section at Low Electron Energies: The Influence of the Screening Parameter

Published online by Cambridge University Press:  05 August 2019

Martin Čalkovský ,
Milena Hugenschmidt ,
Erich Müller  and
Dagmar Gerthsen
Martin Čalkovský
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.
Milena Hugenschmidt
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.
Erich Müller
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.
Dagmar Gerthsen
Affiliation:
Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (KIT), Karlsruhe, Germany.

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 464 - 465
Copyright
Copyright © Microscopy Society of America 2019 

References

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[7]We are grateful for funding by the Deutsche Forschungsgemeinschaft (DFG).Google Scholar