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Development of Two Steradian EDX System for the HD-2700 FE-STEM Equipped with Dual X-MaxN 100 TLE Large Area Windowless SDDs

Published online by Cambridge University Press:  27 August 2014

Takahito Hashimoto
Affiliation:
Science & Medical System Business Group, Hitachi High-Technologies Corporation, 882 Ichige,Hitachinaka, Ibaraki 312-8504, Japan.
Keiji Tamura
Affiliation:
Science & Medical System Business Group, Hitachi High-Technologies Corporation, 882 Ichige,Hitachinaka, Ibaraki 312-8504, Japan.
Hiromi Inada
Affiliation:
Science & Medical System Business Group, Hitachi High-Technologies Corporation, 882 Ichige,Hitachinaka, Ibaraki 312-8504, Japan.
Keitaro Watanabe
Affiliation:
Science & Medical System Business Group, Hitachi High-Technologies Corporation, 882 Ichige,Hitachinaka, Ibaraki 312-8504, Japan.
Yoshihiro Ohtsu
Affiliation:
Science & Medical System Business Group, Hitachi High-Technologies Corporation, 882 Ichige,Hitachinaka, Ibaraki 312-8504, Japan.
Yuya Suzuki
Affiliation:
Science & Medical System Business Group, Hitachi High-Technologies Corporation, 882 Ichige,Hitachinaka, Ibaraki 312-8504, Japan.
Takahiro Sato
Affiliation:
Science & Medical System Business Group, Hitachi High-Technologies Corporation, 882 Ichige,Hitachinaka, Ibaraki 312-8504, Japan.
Takashi Kanemura
Affiliation:
Science & Medical System Business Group, Hitachi High-Technologies Corporation, 882 Ichige,Hitachinaka, Ibaraki 312-8504, Japan.
Simon Burgess
Affiliation:
Nano Analysis, Oxford Instruments, High Wycombe Bucks, HP12 3SE, UK.
James Holland
Affiliation:
Nano Analysis, Oxford Instruments, High Wycombe Bucks, HP12 3SE, UK.
Iain Anderson
Affiliation:
Nano Analysis, Oxford Instruments, High Wycombe Bucks, HP12 3SE, UK.
Susumu Yamaguchi
Affiliation:
Nano Analysis, Oxford Instruments K.K., Shinagawa, Tokyo 140-0002, Japan.
Kuniyasu Nakamura
Affiliation:
Science & Medical System Business Group, Hitachi High-Technologies Corporation, 882 Ichige,Hitachinaka, Ibaraki 312-8504, Japan.

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

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