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Development of Two Different Types of Correlative Light and Electron Microscope for Real Time Imaging and Quick Loading of Sample

Published online by Cambridge University Press:  04 August 2017

In-Yong Park ,
Moonseob Bae  and
Youngkwon Haam
In-Yong Park*
Affiliation:
Division of Industrial Metrology, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-Ro, Yuseong-Gu, Daejeon 34113, South Korea
Moonseob Bae
Affiliation:
Division of Industrial Metrology, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-Ro, Yuseong-Gu, Daejeon 34113, South Korea
Youngkwon Haam
Affiliation:
Division of Industrial Metrology, Korea Research Institute of Standards and Science (KRISS), 267 Gajeong-Ro, Yuseong-Gu, Daejeon 34113, South Korea Department of Physics, Chungbuk National University, Seowon-Gu, Cheongju, Chungbuk 28644, South Korea
*
*Corresponding author: iypark@kriss.re.kr

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1284 - 1285
Copyright
© Microscopy Society of America 2017 

References

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