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Development of Annular Dark Field Confocal Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  26 July 2009

M Takeguchi
Affiliation:
National Institute for Materials Science,Japan
A Hashimoto
Affiliation:
National Institute for Materials Science,Japan
K Mitsuishi
Affiliation:
National Institute for Materials Science,Japan
M Shimojo
Affiliation:
Saitama Institute of Technology,Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009