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The Development of Alternative Markers for Transmission Electron Microscopy and Correlative Transmission Electon and Light Microscopies

  • D Meyer (a1), R Bleher (a1), I Kandela (a1), J Oliver (a1) and R Albrecht (a1)...

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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