Hostname: page-component-7bb8b95d7b-dtkg6 Total loading time: 0 Render date: 2024-09-25T06:20:48.995Z Has data issue: false hasContentIssue false
  • English
  • Français

Depth-Resolution Imaging of Crystalline Nano Clusters on/in Amorphous Films Using Aberration-Corrected TEM

Published online by Cambridge University Press:  23 September 2015

Jun Yamasaki ,
Akihiko Hirata ,
Yoshihiko Hirotsu ,
Kaori Hirahara  and
Nobuo Tanaka
Jun Yamasaki
Affiliation:
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki, Osaka, Japan.
Akihiko Hirata
Affiliation:
Advanced Institute for Materials Research, Tohoku University, Sendai, Japan.
Yoshihiko Hirotsu
Affiliation:
Institute of Scientific and Industrial Research, Osaka University, Ibaraki, Osaka, Japan.
Kaori Hirahara
Affiliation:
Department of Mechanical Engineering, Osaka University, Suita, Osaka, Japan.
Nobuo Tanaka
Affiliation:
EcoTopia Science Institute, Nagoya University, Nagoya, Japan.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1135 - 1136
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Tanaka, N., Yamasaki, J., et al., Nanotechnology 15 (2004) 1779–1784.CrossRefGoogle Scholar
[2] Hirahara, K., et al., Nano Lett. 6 (2006) 1778–1783.CrossRefGoogle Scholar
[3] Yamasaki, J., et al., Ultramicroscopy (2014). doi: 10.1016/j.ultramic.2014.11.005.Google Scholar
[4] This study was partly supported by Grant-in-Aids for Scientific Research on Priority Areas "Materials Science of Bulk Metallic Glasses" (No.18029011) by MEXT and on Innovative Areas "3D active site science" (No.26105001) by JSPS.Google Scholar