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Depth-Dependent Contrast in Probability-Current Imaging from Channeling in Crystalline Materials

Published online by Cambridge University Press:  04 August 2017

Zhen Chen ,
Kayla X. Nguyen ,
Celesta S. Chang ,
Michael C. Cao  and
David A. Muller
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA
Kayla X. Nguyen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA
Celesta S. Chang
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA
Michael C. Cao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA
David A. Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca NY 14853, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca NY 14853, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 478 - 479
Copyright
© Microscopy Society of America 2017 

References

References:

[1] Shibata, N, et al, Nat. Phys 8 2012). p. 611.CrossRefGoogle Scholar
[2] Lohr, M, et al, Ultramicroscopy 117 2012). p. 7.CrossRefGoogle Scholar
[3] Tate, MW, et al, Microscopy and Microanalysis 22 2016). p. 237.CrossRefGoogle Scholar
[4] Lubk, A & Zweck, J Phys. Rev. A 91 2015 023805.CrossRefGoogle Scholar
[5] Close, R, et al, Ultramicroscopy 159 2015). p. 124.CrossRefGoogle Scholar
[6] Lazic, I, et al, Ultramicroscopy 160 2016). p. 265.CrossRefGoogle Scholar
[7] Chang, CS, et al, Microscopy and Microanalysis 22 2016). p. 1414.CrossRefGoogle Scholar
[8] Findlay, SD, et al, Ultramicroscopy 110 2010). p. 903.CrossRefGoogle Scholar
[9] Research supported by PARADIM, an NSF MIP (DMR-1539918), with electron microscope facilities support from CCMR, an NSF MRSEC (DMR-1120296).Google Scholar